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Characterization of nickel-silicides by HAADF-STEM imaging
Publication:
Characterization of nickel-silicides by HAADF-STEM imaging
Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verleysen, Eveline
;
Bender, Hugo
;
Richard, Olivier
;
Schryvers, Dominique
;
Vandervorst, Wilfried
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Abstract
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1849
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Acq. date: 2025-12-08
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Views
1849
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-08
Citations