Publication:
Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures
Date
| dc.contributor.author | Criel, Steven | |
| dc.contributor.author | Haelvoet, Kurt | |
| dc.contributor.author | Martens, Luc | |
| dc.contributor.author | De Zutter, Daniel | |
| dc.contributor.author | Franchois, Ann | |
| dc.contributor.author | De Smedt, R. | |
| dc.contributor.author | De Langhe, Pascal | |
| dc.contributor.imecauthor | Martens, Luc | |
| dc.contributor.imecauthor | De Zutter, Daniel | |
| dc.date.accessioned | 2021-09-29T13:04:46Z | |
| dc.date.available | 2021-09-29T13:04:46Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/573 | |
| dc.source.beginpage | 471 | |
| dc.source.conference | Atlanta 1995.EMC - a Global Concern. IEEE 1995 International Symposium on Electromagnetic Compatibility. Symposium Record; Augus | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 474 | |
| dc.title | Theoretical and experimental quantitative characterization of the near-fields of printed circuit board interconnection structures | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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