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The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
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The impact of Fe and Cu contamination in the 1012 at/cm2 range on the performance of junction diodes
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Date
1996
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rotondaro, Antonio
;
Vandamme, Ewout
;
Vanhellemont, Jan
;
Simoen, Eddy
;
Heyns, Marc
;
Claeys, C.
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1805
since deposited on 2021-09-29
Acq. date: 2025-12-15
Citations
Metrics
Views
1805
since deposited on 2021-09-29
Acq. date: 2025-12-15
Citations