Publication:

Nanoprober based EBIC measurements for nanowire transistor structures

Date

2011
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorArstila, Kai
dc.contributor.authorHantschel, Thomas
dc.contributor.authorSchulze, Andreas
dc.contributor.authorVandooren, Anne
dc.contributor.authorVerhulst, Anne
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.date.accessioned2021-10-19T12:29:50Z
dc.date.available2021-10-19T12:29:50Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18494
dc.source.conferenceMicro and Nano Engineering Conference - MNE
dc.source.conferencedate19/09/2011
dc.source.conferencelocationBerlin Germany
dc.title

Nanoprober based EBIC measurements for nanowire transistor structures

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations