Publication:

Temperature influence on experimental analog behavior of MISHEMTs

 
dc.contributor.authorPerina, Welder F.
dc.contributor.authorMartino, Joao A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorCollaert, Nadine
dc.contributor.authorAgopian, Paula G. D.
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2024-12-18T09:48:47Z
dc.date.available2024-11-28T16:44:41Z
dc.date.available2024-12-18T09:48:47Z
dc.date.issued2025
dc.description.wosFundingTextThe authors acknowledge CNPq and CAPES for the financial support. The devices have been processed in the frame of imec's Core Partner Program on Logic Devices.
dc.identifier.doi10.1016/j.sse.2024.109028
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44859
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpageArt. 109028
dc.source.endpageN/A
dc.source.issueJanuary
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages6
dc.source.volume223
dc.subject.keywordsHEMTS
dc.subject.keywordsGAN
dc.title

Temperature influence on experimental analog behavior of MISHEMTs

dc.typeJournal article
dspace.entity.typePublication
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