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Conference contributions
Impact of body bias on nanoscaled MOSFETs with individual trapped gate oxide charges
Publication:
Impact of body bias on nanoscaled MOSFETs with individual trapped gate oxide charges
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Franco, Jacopo
;
Kaczer, Ben
;
Toledano Luque, Maria
;
Roussel, Philippe
;
Ragnarsson, Lars-Ake
;
Eneman, Geert
;
Grasser, Tibor
;
Groeseneken, Guido
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1791
since deposited on 2021-10-19
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Acq. date: 2026-02-24
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Statistics
Views
1791
since deposited on 2021-10-19
1
last month
Acq. date: 2026-02-24
Citations