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Strain in PFETs analyzed by nano beam diffraction
Publication:
Strain in PFETs analyzed by nano beam diffraction
Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Favia, Paola
;
Eneman, Geert
;
Yamaguchi, Shinpei
;
Ortolland, Claude
;
Hoffmann, Thomas Y.
;
Richard, Olivier
;
Bender, Hugo
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1886
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1886
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations