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Articles
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point
Publication:
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Noltsis, Michalis
;
Maragkoudaki, Eleni
;
Rodopoulos, Dimitrios
;
Catthoor, Francky
;
Soudris, Dimitrios
Journal
Integration, the VLSI Journal
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1967
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1967
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-11
Citations