The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability

dc.contributor.author	Witvrouw, Ann
dc.contributor.author	Van Dooren, Sofie
dc.contributor.author	Wouters, Dirk
dc.contributor.author	Van Dievel, Marc
dc.contributor.author	Maex, Karen
dc.contributor.imecauthor	Van Dievel, Marc
dc.contributor.imecauthor	Maex, Karen
dc.date.accessioned	2021-09-29T15:53:55Z
dc.date.available	2021-09-29T15:53:55Z
dc.date.embargo	9999-12-31
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1661
dc.source.beginpage	1847
dc.source.endpage	1850
dc.source.journal	Microelectronics and Reliability
dc.source.volume	36
dc.title	The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability
dc.type	Journal article
dspace.entity.type	Publication
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