Publication:

Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction tunnel-FETs

Date

2013
Journal article
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dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorLeonelli, Daniele
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorDevriendt, Katia
dc.contributor.authorDemand, Marc
dc.contributor.authorLoo, Roger
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorLeonelli, Daniele
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorDevriendt, Katia
dc.contributor.imecauthorDemand, Marc
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecDevriendt, Katia::0000-0002-0662-7926
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.date.accessioned2021-10-21T13:45:47Z
dc.date.available2021-10-21T13:45:47Z
dc.date.issued2013
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23295
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0038110113000397
dc.source.beginpage50
dc.source.endpage55
dc.source.journalSolid-State Electronics
dc.source.volume83
dc.title

Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction tunnel-FETs

dc.typeJournal article
dspace.entity.typePublication
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