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Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs
Publication:
Study of random telegraph noise in UTBOX silicon-on-insulator nMOSFETs
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Li, Chi-Kang
;
Fang, Wen
;
Simoen, Eddy
;
Aoulaiche, Marc
;
Wu, Yuh-Renn
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
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1932
since deposited on 2021-10-22
437
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1932
since deposited on 2021-10-22
437
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations