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Conference contributions
Hot carrier stress and breakdown impact on high-frequency MOSFET analog performance
Publication:
Hot carrier stress and breakdown impact on high-frequency MOSFET analog performance
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Date
2004-10
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pantisano, Luigi
;
Schreurs, Dominique
;
Kaczer, Ben
;
Simoen, Eddy
;
Groeseneken, Guido
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1828
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations
Metrics
Views
1828
since deposited on 2021-10-15
Acq. date: 2025-12-15
Citations