Publication:
Validation of immersion lithography OPC model accuracy
Date
| dc.contributor.author | Estroff, Andrew | |
| dc.contributor.author | Bailey, George | |
| dc.contributor.author | Kostas, Adam | |
| dc.contributor.author | Vandenberghe, Geert | |
| dc.contributor.author | Hendrickx, Eric | |
| dc.contributor.imecauthor | Vandenberghe, Geert | |
| dc.contributor.imecauthor | Hendrickx, Eric | |
| dc.date.accessioned | 2021-10-16T01:31:36Z | |
| dc.date.available | 2021-10-16T01:31:36Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10437 | |
| dc.source.conference | 2nd International Symposium on Immersion Lithography | |
| dc.source.conferencedate | 12/09/2005 | |
| dc.source.conferencelocation | Brugge Belgium | |
| dc.title | Validation of immersion lithography OPC model accuracy | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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