A low-frequency noise study of state-of-the-art silicon n+p junction diodes

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Vanhellemont, Jan
dc.contributor.author	Claeys, Cor
dc.contributor.author	Bosman, Gijs
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-29T13:16:49Z
dc.date.available	2021-09-29T13:16:49Z
dc.date.embargo	9999-12-31
dc.date.issued	1995
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/883
dc.source.beginpage	537
dc.source.conference	Noise in Physical Systems and 1/f Fluctuations - ICNF. Proceedings of the 13th International Conference
dc.source.conferencedate	29/05/1995
dc.source.conferencelocation	Palanga Lithuania
dc.source.endpage	540
dc.title	A low-frequency noise study of state-of-the-art silicon n+p junction diodes
dc.type	Proceedings paper
dspace.entity.type	Publication
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