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Analysis of Leakage Mechanisms in AlN Nucleation Layers on p-Si and p-SOI Substrates
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Analysis of Leakage Mechanisms in AlN Nucleation Layers on p-Si and p-SOI Substrates
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Weihang
;
Simoen, Eddy
;
Zhao, Ming
;
Zhang, J.
Journal
IEEE Transactions on Electron Devices
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1889
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Acq. date: 2025-12-09
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Metrics
Views
1889
since deposited on 2021-10-28
2
last month
Acq. date: 2025-12-09
Citations