Publication:

Reliability of SiGe channel MOS

Date

2012-10

Meeting abstract

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Author(s)

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Toledano Luque, Maria

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Roussel, Philippe

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Kauerauf, Thomas

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Witters, Liesbeth

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Hellings, Geert

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Ragnarsson, Lars-Ake

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Horiguchi, Naoto

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Groeseneken, Guido

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