Publication:

Analysis of gate-metal resistance in CMOS-compatible RF GaN HEMTs

Date

2020

Journal article

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Author(s)

ElKashlan, Rana Y.

;

Rodriguez, Raul

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;

;

Peralagu, Uthayasankaran

;

;

;

;

;

Parvais, Bertrand

;

Collaert, Nadine

Journal

IEEE Transactions on Electron Devices

Metrics

2029 since deposited on 2021-10-28

1last month

Acq. date: 2025-12-13