Analysis of gate-metal resistance in CMOS-compatible RF GaN HEMTs

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Author(s)

ElKashlan, Rana Y.

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Rodriguez, Raul

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Peralagu, Uthayasankaran

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Parvais, Bertrand

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Collaert, Nadine

Journal

IEEE Transactions on Electron Devices

Metrics

2028 since deposited on 2021-10-28

2last week

Acq. date: 2025-10-30