Publication:

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

Date

2021-04-01
Journal article
https://doi.org/10.1007/s10836-021-05943-3
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dc.contributor.authorGao, Zhan
dc.contributor.authorHu, Min-Chun
dc.contributor.authorMalagi, Santosh
dc.contributor.authorSwenton, Joe
dc.contributor.authorHuisken, Jos
dc.contributor.authorGoossens, Kees
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.editorAgrawal, Vishwani D.
dc.contributor.imecauthorGao, Zhan
dc.contributor.imecauthorHu, Min-Chun
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.date.accessioned2022-06-24T07:58:49Z
dc.date.available2021-11-02T16:01:45Z
dc.date.available2022-05-19T10:34:12Z
dc.date.available2022-06-24T07:58:49Z
dc.date.issued2021-04-01
dc.identifier.doi10.1007/s10836-021-05943-3
dc.identifier.issn0923-8174
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37933
dc.publisherSPRINGER
dc.source.beginpage161
dc.source.endpage189
dc.source.issue2
dc.source.journalJOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
dc.source.numberofpages29
dc.source.volume37
dc.title

Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality

dc.typeJournal article
dspace.entity.typePublication
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