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Development and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques

Date

2017
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dc.contributor.authorDialameh, Masoud
dc.contributor.authorFerrarese Lupi, Federico
dc.contributor.authorDe Leo, Natascia
dc.contributor.authorBoarino, Luca
dc.contributor.authorHönicke, Philipp
dc.contributor.authorKayser, Yves
dc.contributor.authorBeckhoff, Burkhard
dc.contributor.authorWeimann, Thomas
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.date.accessioned2021-10-24T04:19:12Z
dc.date.available2021-10-24T04:19:12Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28249
dc.identifier.urlhttp://www.european-mrs.com/altech-2017-analytical-techniques-precise-characterization-nano-materials-emrs
dc.source.conferenceE-MRS Spring Meeting Symposium on Analytical Techniques for Precise Characterization of Nano Materials - ALTECH
dc.source.conferencedate22/05/2017
dc.source.conferencelocationStrasbourg France
dc.title

Development and reference-free characterization of 3D nanostructures as potential calibration sample for analytical techniques

dc.typeOral presentation
dspace.entity.typePublication
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