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Articles
Low frequency noise assessment for deep submicron CMOS technology nodes
Publication:
Low frequency noise assessment for deep submicron CMOS technology nodes
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Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Claeys, Cor
;
Mercha, Abdelkarim
;
Simoen, Eddy
Journal
Journal of the Electrochemical Society
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1849
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Acq. date: 2025-12-15
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Views
1849
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-15
Citations