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Electrical and physical characterization of MOSFETs with MBE grown La2HfO7 and HfO2 high-k dielectrics integrated in a conventional flow
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1959 since deposited on 2021-10-16
Acq. date: 2025-12-08
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1959 since deposited on 2021-10-16
Acq. date: 2025-12-08
Citations