Publication:
Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Rafi, Joan Marc | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Neimash, V. | |
| dc.contributor.author | Kraitchinski, A. | |
| dc.contributor.author | Kras'ko, M. | |
| dc.contributor.author | Tischenko, V. | |
| dc.contributor.author | Voitovych, V. | |
| dc.contributor.author | Versluys, J. | |
| dc.contributor.author | Clauws, P. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-15T06:42:52Z | |
| dc.date.available | 2021-10-15T06:42:52Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8154 | |
| dc.source.beginpage | 7184 | |
| dc.source.endpage | 7188 | |
| dc.source.issue | 3 | |
| dc.source.journal | Japanese Journal of Applied Physics. Part 1: Regular Papers | |
| dc.source.volume | 42 | |
| dc.title | Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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