Publication:

Resistance modeling of short-range connections: impact of current spreading

Date

2023-01-23
Journal article
https://doi.org/10.35848/1347-4065/acad0b
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dc.contributor.authorTierno, Davide
dc.contributor.authorVega Gonzalez, Victor
dc.contributor.authorEsposto, Simone
dc.contributor.authorCiofi, Ivan
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorVega Gonzalez, Victor
dc.contributor.imecauthorEsposto, Simone
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecVega Gonzalez, Victor::0000-0002-4320-0585
dc.contributor.orcidimecEsposto, Simone::0009-0004-4809-7806
dc.date.accessioned2024-03-12T11:04:22Z
dc.date.available2023-02-16T03:20:12Z
dc.date.available2023-02-17T08:35:20Z
dc.date.available2024-03-12T11:04:22Z
dc.date.embargo2024-01-24
dc.date.issued2023-01-23
dc.identifier.doi10.35848/1347-4065/acad0b
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41102
dc.publisherIOP Publishing Ltd
dc.source.beginpageSC1034-1
dc.source.endpageSC1034-7
dc.source.issueSC
dc.source.journalJAPANESE JOURNAL OF APPLIED PHYSICS
dc.source.numberofpages7
dc.source.volume62
dc.subject.disciplineElectrical & electronic engineering
dc.subject.keywordsinterconnects, 4T, TCAD, Ru, MOL, VHV
dc.title

Resistance modeling of short-range connections: impact of current spreading

dc.typeJournal article
dspace.entity.typePublication
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