Publication:

Study of recombination properties of neutron transmutation doped wafers

Date

1997
Journal article
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dc.contributor.authorGaubas, Eugenijus
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClauws, P.
dc.contributor.authorKraner, H. W.
dc.contributor.authorVilkelis, G.
dc.contributor.authorSmilga, A. P.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-30T08:18:39Z
dc.date.available2021-09-30T08:18:39Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1892
dc.source.beginpage1092
dc.source.endpage1099
dc.source.issue9
dc.source.journalSemiconductor Science and Technology
dc.source.volume12
dc.title

Study of recombination properties of neutron transmutation doped wafers

dc.typeJournal article
dspace.entity.typePublication
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