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Influence of photoresist thinning and underlayer film on e-beam using eP5 for High-NA patterning
Publication:
Influence of photoresist thinning and underlayer film on e-beam using eP5 for High-NA patterning
Date
2022
Proceedings Paper
https://doi.org/10.1117/12.2641768
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hasan, Mahmudul
;
Beral, Christophe
;
Lorusso, Gian
;
De Simone, Danilo
;
Moussa, Alain
;
Van den Heuvel, Dieter
;
Charley, Anne-Laure
;
Leray, Philippe
Journal
Proceedings of SPIE
Abstract
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1191
since deposited on 2023-03-22
Acq. date: 2025-10-26
Citations
Metrics
Views
1191
since deposited on 2023-03-22
Acq. date: 2025-10-26
Citations