Publication:
The ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's
Date
| dc.contributor.author | Verhaege, K. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.author | Colinge, Jean-Pierre | |
| dc.contributor.author | Maes, Herman | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T12:51:50Z | |
| dc.date.available | 2021-09-29T12:51:50Z | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/435 | |
| dc.source.beginpage | 555 | |
| dc.source.endpage | 556 | |
| dc.source.journal | Microelectronics and Reliability | |
| dc.source.volume | 35 | |
| dc.title | The ESD Protection Mechanisms and Related Failure Modes and Mechanisms Observed in SOI nMOSFET's | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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