Publication:

Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits

Date

2003
Presentation
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorCreten, Ybe
dc.contributor.authorMerken, Patrick
dc.contributor.authorDe Moor, Piet
dc.contributor.authorPutzeys, Jan
dc.contributor.authorClaeys, Cor
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorMohammadzadeh, A.
dc.contributor.authorNickson, R.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.imecauthorPutzeys, Jan
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecPutzeys, Jan::0000-0001-8834-5852
dc.contributor.orcidimecVan Hoof, Chris::0000-0002-4645-3326
dc.date.accessioned2021-10-15T06:41:34Z
dc.date.available2021-10-15T06:41:34Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8149
dc.source.conference7th European Conference on Radiation and Its Effects on Components and Systems - RADECS
dc.source.conferencedate15/09/2003
dc.source.conferencelocationNoordwijk The Netherlands
dc.title

Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits

dc.typeOral presentation
dspace.entity.typePublication
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