High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (Editorial)

dc.contributor.author	Eyben, Pierre
dc.contributor.imecauthor	Eyben, Pierre
dc.date.accessioned	2021-10-21T07:33:04Z
dc.date.available	2021-10-21T07:33:04Z
dc.date.embargo	9999-12-31
dc.date.issued	2013
dc.identifier.issn	2190-4286
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/22326
dc.identifier.url	http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-4-35
dc.source.beginpage	318
dc.source.endpage	319
dc.source.journal	Beilstein Journal of Nanotechnology
dc.source.volume	4
dc.title	High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (Editorial)
dc.type	Journal article
dspace.entity.type	Publication
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