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Low-frequency noise characterisation of g-irradiated silicon-on-insulator MOSFETs

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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T13:16:34Z
dc.date.available2021-09-29T13:16:34Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/872
dc.source.beginpage75
dc.source.endpage81
dc.source.issue1
dc.source.journalNuclear Instruments and Methods in Physics Research B
dc.source.volume95
dc.title

Low-frequency noise characterisation of g-irradiated silicon-on-insulator MOSFETs

dc.typeJournal article
dspace.entity.typePublication
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