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Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers with a linearly graded germanium profile
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Measurement and simulation of boron diffusion in strained Si1- xGex epitaxial layers with a linearly graded germanium profile
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Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Krishnasamy, Rajendran
;
Schoenmaker, Wim
Journal
Solid-State Electronics
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1978
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-17
Citations
Metrics
Views
1978
since deposited on 2021-10-14
2
last month
Acq. date: 2025-12-17
Citations