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Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI

Date

2013
Proceedings Paper
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dc.contributor.authorGrasser, T.
dc.contributor.authorRott, K.
dc.contributor.authorReisinger, H.
dc.contributor.authorWaltl, M.
dc.contributor.authorWagner, P.
dc.contributor.authorSchanovsky, F.
dc.contributor.authorGoes, W.
dc.contributor.authorPobegen, G.
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-21T07:59:27Z
dc.date.available2021-10-21T07:59:27Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22427
dc.source.beginpage409
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate9/12/2013
dc.source.conferencelocationWashington, DC USA
dc.source.endpage412
dc.title

Hydrogen-related volatile defects as the possible cause for the recoverable component of NBTI

dc.typeProceedings paper
dspace.entity.typePublication
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