Publication:

Integration Of Solution-Processed BaTiO3 Thin Films with High Pockels Coefficient on Photonic Platforms

Date

2024
Journal article
https://doi.org/10.1002/adfm.202403024
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dc.contributor.authorPicavet, Ewout
dc.contributor.authorLievens, Enes
dc.contributor.authorDe Geest, Kobe
dc.contributor.authorRijckaert, Hannes
dc.contributor.authorFernandez, Edgar Gutierrez
dc.contributor.authorBikondoa, Oier
dc.contributor.authorSolano, Eduardo
dc.contributor.authorPaturi, Petriina
dc.contributor.authorSingh, Nishant
dc.contributor.authorPannier, Tinus
dc.contributor.authorLiu, Jiayi
dc.contributor.authorYin, Xin
dc.contributor.authorVan Thourhout, Dries
dc.contributor.authorBeeckman, Jeroen
dc.contributor.authorDe Buysser, Klaartje
dc.contributor.authorlievens
dc.contributor.imecauthorLievens, Enes
dc.contributor.imecauthorDe Geest, Kobe
dc.contributor.imecauthorSingh, Nishant
dc.contributor.imecauthorPannier, Tinus
dc.contributor.imecauthorYin, Xin
dc.contributor.imecauthorVan Thourhout, Dries
dc.contributor.orcidextPicavet, Ewout::0000-0001-8196-2807
dc.contributor.orcidextRijckaert, Hannes::0000-0002-6078-2919
dc.contributor.orcidextBikondoa, Oier::0000-0001-9004-9032
dc.contributor.orcidextSolano, Eduardo::0000-0002-2348-2271
dc.contributor.orcidextPaturi, Petriina::0000-0002-6240-2801
dc.contributor.orcidextLiu, Jiayi::0000-0001-6307-5147
dc.contributor.orcidextBeeckman, Jeroen::0000-0002-0711-2465
dc.contributor.orcidextDe Buysser, Klaartje::0000-0001-7462-2484
dc.contributor.orcidimecDe Geest, Kobe::0000-0002-5669-975X
dc.contributor.orcidimecSingh, Nishant::0000-0003-0609-1145
dc.contributor.orcidimecYin, Xin::0000-0002-9672-6652
dc.contributor.orcidimecPannier, Tinus::0000-0003-2225-0505
dc.contributor.orcidimecVan Thourhout, Dries::0000-0003-0111-431X
dc.date.accessioned2025-05-19T15:24:46Z
dc.date.available2025-05-19T15:24:46Z
dc.date.embargo2024-05-25
dc.date.issued2024
dc.description.wosFundingTextE.P. and E.L. contributed equally to this work. The authors thank Laura Van Bossele and Els Bruneel for performing the XRD (theta-2 theta) and XPS measurements, respectively. GIWAXS experiments were performed at the NCD-SWEET beamline at ALBA Synchrotron with the collaboration of ALBA staff. TEM measurements were performed by H.R. at the UGent TEM Core Facility. E.P. gratefully acknowledges the support and funding as an SB-PhD Fellow of the Research Foundation Flanders (FWO, grant number 3S041219). H.R. gratefully acknowledges the support and funding as a postdoctoral fellow in fundamental research by the Research Foundation Flanders (FWO, grant number 1273621N). P.P. acknowledges the Jenny and Antti Wihuri Foundation for the financial support. This work was financially supported by the Special Research Fund - UGent (BOF20/GOA/027).
dc.identifier.doi10.1002/adfm.202403024
dc.identifier.issn1616-301X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45686
dc.publisherWILEY-V C H VERLAG GMBH
dc.source.beginpageArt. 2403024
dc.source.endpageN/A
dc.source.issue37
dc.source.journalADVANCED FUNCTIONAL MATERIALS
dc.source.numberofpages10
dc.source.volume34
dc.subject.keywordsSILICON
dc.subject.keywordsMODULATOR
dc.subject.keywordsBEHAVIOR
dc.title

Integration Of Solution-Processed BaTiO3 Thin Films with High Pockels Coefficient on Photonic Platforms

dc.typeJournal article
dspace.entity.typePublication
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