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Scanning near-field millimeter wave microscope combining dielectric tapered waveguides and metal tips

Date

2012
Proceedings Paper
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dc.contributor.authorZhu, Bin
dc.contributor.authorVanloocke, Sam
dc.contributor.authorStiens, Johan
dc.contributor.authorDe Zutter, Daniel
dc.contributor.authorVounckx, Roger
dc.contributor.imecauthorStiens, Johan
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.imecauthorVounckx, Roger
dc.date.accessioned2021-10-20T19:44:00Z
dc.date.available2021-10-20T19:44:00Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21935
dc.source.beginpage536
dc.source.conferenceProgress in Electromagnetics Research Symposium - PIERS
dc.source.conferencedate12/09/2011
dc.source.conferencelocationSuzhou China
dc.source.endpage539
dc.title

Scanning near-field millimeter wave microscope combining dielectric tapered waveguides and metal tips

dc.typeProceedings paper
dspace.entity.typePublication
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