Publication:
Series resistance effects in submicron MOS transistors operated from 300 K down to 4.2 K
Date
| dc.contributor.author | Gutiérrez Dominguez, E. A. | |
| dc.contributor.author | Deferm, Ludo | |
| dc.contributor.author | Declerck, Gilbert | |
| dc.contributor.imecauthor | Deferm, Ludo | |
| dc.contributor.imecauthor | Declerck, Gilbert | |
| dc.date.accessioned | 2021-09-29T12:41:51Z | |
| dc.date.available | 2021-09-29T12:41:51Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 1994 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/184 | |
| dc.source.beginpage | C6 | |
| dc.source.endpage | 31-36 | |
| dc.source.issue | C6 | |
| dc.source.journal | Journal de Physique IV (Colloque) | |
| dc.source.volume | 4 | |
| dc.title | Series resistance effects in submicron MOS transistors operated from 300 K down to 4.2 K | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |