Publication:

Bias dependent admittance spectroscopy of thin film solar cells: KF post deposition treatment, accelerated lifetime testing, and their effect on the CVf loss maps

Date

2021
Journal article
https://doi.org/10.1016/j.solmat.2021.111289
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dc.contributor.authorKohl, Thierry
dc.contributor.authorBrammertz, Guy
dc.contributor.authorde Wild, Jessica
dc.contributor.authorBuldu, Dilara Gokcen
dc.contributor.authorBirant, Gizem
dc.contributor.authorMeuris, Marc
dc.contributor.authorPoortmans, Jef
dc.contributor.authorVermang, Bart
dc.contributor.imecauthorKohl, Thierry
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorde Wild, Jessica
dc.contributor.imecauthorBuldu, Dilara Gokcen
dc.contributor.imecauthorBirant, Gizem
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorVermang, Bart
dc.contributor.orcidimecKohl, Thierry::0000-0002-8232-0598
dc.contributor.orcidimecBuldu, Dilara Gokcen::0000-0003-0660-043X
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecVermang, Bart::0000-0003-2669-2087
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecKohl, Thierry::4321-4321-4321-4321
dc.contributor.orcidimecde Wild, Jessica::0000-0003-2291-4674
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2022-03-07T10:08:11Z
dc.date.available2021-11-02T15:56:59Z
dc.date.available2022-03-07T10:08:11Z
dc.date.issued2021
dc.identifier.doi10.1016/j.solmat.2021.111289
dc.identifier.issn0927-0248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37561
dc.publisherELSEVIER
dc.source.issuena
dc.source.journalSOLAR ENERGY MATERIALS AND SOLAR CELLS
dc.source.numberofpages111289
dc.source.volume231
dc.subject.keywordsPOSTDEPOSITION TREATMENT
dc.subject.keywordsGRAIN-BOUNDARIES
dc.subject.keywordsEFFICIENCY
dc.subject.keywordsINTERFACE
dc.subject.keywordsZN(S,O)
dc.subject.keywordsCU(IN
dc.title

Bias dependent admittance spectroscopy of thin film solar cells: KF post deposition treatment, accelerated lifetime testing, and their effect on the CVf loss maps

dc.typeJournal article
dspace.entity.typePublication
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