Publication:
Scanning probe tomography for advanced material characterization
Date
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.date.accessioned | 2021-10-22T00:53:58Z | |
| dc.date.available | 2021-10-22T00:53:58Z | |
| dc.date.issued | 2014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23621 | |
| dc.source.conference | IEEE International Integrated Reliability Workshop - IIRW | |
| dc.source.conferencedate | 12/10/2014 | |
| dc.source.conferencelocation | Fallen Leaf Lake, CA USA | |
| dc.title | Scanning probe tomography for advanced material characterization | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |