Publication:

Investigation of ferroelectric HfZrO FET for steep slope applications

Date

2018
Meeting abstract
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dc.contributor.authorAlam, Md Nur Kutubul
dc.contributor.authorKaczer, Ben
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorHeyns, Marc
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorAlam, Md Nur Kutubul
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-25T16:31:44Z
dc.date.available2021-10-25T16:31:44Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30097
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8640204
dc.source.beginpage1
dc.source.conference2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
dc.source.conferencedate15/10/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage3
dc.title

Investigation of ferroelectric HfZrO FET for steep slope applications

dc.typeMeeting abstract
dspace.entity.typePublication
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