Publication:
Characterization of electron traps in Si-capped Ge MOSFETs with HfO2/SiO2 gate stack
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1865 since deposited on 2021-10-20
1last month
Acq. date: 2026-02-28
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Views
1865 since deposited on 2021-10-20
1last month
Acq. date: 2026-02-28
Citations