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Trap spectroscopy and Ta penetration induced charge trapping in Porous SiOCH low-k dielectrics
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Trap spectroscopy and Ta penetration induced charge trapping in Porous SiOCH low-k dielectrics
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Date
2013
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Li, Yunlong
;
Wu, Chen
;
Degraeve, Robin
;
Croes, Kristof
;
Barbarin, Yohan
;
Baklanov, Mikhaïl
;
Tokei, Zsolt
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1859
since deposited on 2021-10-21
1
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Acq. date: 2025-12-15
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Metrics
Views
1859
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-15
Citations