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Device-based threading dislocation assessment in germanium hetero-epitaxy
Publication:
Device-based threading dislocation assessment in germanium hetero-epitaxy
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Hsu, Brent
;
Eneman, Geert
;
Rosseel, Erik
;
Loo, Roger
;
Arimura, Hiroaki
;
Horiguchi, Naoto
;
Claeys, Cor
;
Wen, Wei-Chen
;
Nakashima, Hiroshi
;
Oliveira, Alberto
;
Agopian, Paula G.D.
;
Martino, Joao
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1908
since deposited on 2021-10-27
Acq. date: 2025-12-11
Citations
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Views
1908
since deposited on 2021-10-27
Acq. date: 2025-12-11
Citations