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First demonstration of vertically stacked gate-all-around highly strained germanium nanowire pFETs
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First demonstration of vertically stacked gate-all-around highly strained germanium nanowire pFETs
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Date
2018
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Capogreco, Elena
;
Witters, Liesbeth
;
Arimura, Hiroaki
;
Sebaai, Farid
;
Porret, Clément
;
Hikavyy, Andriy
;
Loo, Roger
;
Milenin, Alexey
;
Eneman, Geert
;
Favia, Paola
;
Bender, Hugo
;
Wostyn, Kurt
;
Dentoni Litta, Eugenio
;
Schulze, Andreas
;
Vrancken, Christa
;
Opdebeeck, Ann
;
Mitard, Jerome
;
Langer, Robert
;
Holsteyns, Frank
;
Waldron, Niamh
;
Barla, Kathy
;
De Heyn, Vincent
;
Mocuta, Dan
;
Collaert, Nadine
Journal
IEEE Transactions on Electron Devices
Abstract
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1996
since deposited on 2021-10-25
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last month
1
last week
Acq. date: 2026-08-05
Citations