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Improved nano-scale characterization of high-k dielectrics with vacuum C-AFM
Publication:
Improved nano-scale characterization of high-k dielectrics with vacuum C-AFM
Date
2007
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Polspoel, Wouter
;
Aguilera, Lidia
;
Vandervorst, Wilfried
;
Volodin, Alexander
;
Van Haesendonck, Chris
;
Conard, Thierry
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1886
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1886
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations