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Recent insights in CMOS reliability characterization by the use of degradation maps

Date

2018
Proceedings Paper
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dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorKaczer, Ben
dc.contributor.authorChuang, Kent
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-25T16:59:44Z
dc.date.available2021-10-25T16:59:44Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30344
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8565676
dc.source.conference14th International Conference on Solid-State and Integrated Circuit Technology - ICSICT
dc.source.conferencedate31/10/2018
dc.source.conferencelocationQingdao China
dc.title

Recent insights in CMOS reliability characterization by the use of degradation maps

dc.typeProceedings paper
dspace.entity.typePublication
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