Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Wafer backside cleaning strategies for high-k/metal gate processing
Publication:
Wafer backside cleaning strategies for high-k/metal gate processing
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vos, Rita
;
Kesters, Els
;
Garaud, Sylvain
;
De Waele, Rita
;
Kenis, Karine
;
Lux, Marcel
;
Kraus, Harald
;
Snow, Jim
;
Shamiryan, Denis
;
Catana, Gabriela
;
Deweerd, Wim
;
Schram, Tom
;
De Gendt, Stefan
;
Mertens, Paul
Journal
Abstract
Description
Metrics
Views
1990
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1990
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations