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Quantitative determination of the dielectric constant of the interfacial layer in PZT ferroelectric capacitors

Date

1998
Proceedings Paper
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dc.contributor.authorBartic, Andrei
dc.contributor.authorWouters, Dirk
dc.contributor.authorJin, S.
dc.contributor.authorNorga, Gerd
dc.contributor.authorBender, Hugo
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorBender, Hugo
dc.date.accessioned2021-09-30T11:26:02Z
dc.date.available2021-09-30T11:26:02Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2367
dc.source.beginpage73
dc.source.conferenceApplications of Ferroelectrics- ISAF. Proceedings of the 11th IEEE International Symposium
dc.source.conferencedate24/08/1998
dc.source.conferencelocationMontreux Switzerland
dc.source.endpage76
dc.title

Quantitative determination of the dielectric constant of the interfacial layer in PZT ferroelectric capacitors

dc.typeProceedings paper
dspace.entity.typePublication
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