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Testing for internal defects in library cells
Publication:
Testing for internal defects in library cells
Date
2017-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, Zhan
;
Jiao, Hailong
;
Huisken, Jos
;
Marinissen, Erik Jan
;
Chickermane, Vivek
;
Swenton, Joe
;
Wisnesky, Carl
;
Goossens, Kees
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1889
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
1889
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations