Publication:
Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition
| dc.contributor.author | Vici, Andrea | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Vici, Andrea | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Degraeve, Robin::0000-0002-4609-5573 | |
| dc.contributor.orcidimec | Vici, Andrea::0000-0002-3614-9590 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.date.accessioned | 2023-12-15T08:03:16Z | |
| dc.date.available | 2023-12-03T17:03:02Z | |
| dc.date.available | 2023-12-15T08:03:16Z | |
| dc.date.issued | 2023 | |
| dc.identifier.doi | 10.1109/TED.2023.3326430 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43218 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 6512 | |
| dc.source.endpage | 6519 | |
| dc.source.issue | 12 | |
| dc.source.journal | IEEE TRANSACTIONS ON ELECTRON DEVICES | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 70 | |
| dc.subject.keywords | ULTRATHIN SILICON DIOXIDE | |
| dc.subject.keywords | SUBSTRATE-HOT-ELECTRON | |
| dc.subject.keywords | OXIDE BREAKDOWN | |
| dc.subject.keywords | TRAP GENERATION | |
| dc.subject.keywords | GATE | |
| dc.subject.keywords | RELIABILITY | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | PREDICTION | |
| dc.subject.keywords | DEPENDENCE | |
| dc.subject.keywords | PHYSICS | |
| dc.title | Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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