Publication:
Correction to: Impact of vacuum ultraviolet photons on ultrathin negative tone resists for extreme ultraviolet lithography during plasma etching (vol 43, 023007, 2025)
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0003-4815-3770 | |
| cris.virtual.orcid | 0000-0003-4523-9624 | |
| cris.virtual.orcid | 0000-0003-2499-0240 | |
| cris.virtual.orcid | 0000-0003-3775-3578 | |
| cris.virtual.orcid | 0000-0002-4748-7763 | |
| cris.virtualsource.department | 0cad242e-b04f-43bb-be0d-cfcf7a41da8f | |
| cris.virtualsource.department | feed31a7-95f4-46e2-b373-180a042de8af | |
| cris.virtualsource.department | db320297-cc3b-4024-b9e1-7ae8d8240862 | |
| cris.virtualsource.department | 1fd77399-4d0a-4004-8a7f-9634c67c90de | |
| cris.virtualsource.department | e0967756-7be0-4062-86d9-76768115dc1b | |
| cris.virtualsource.orcid | 0cad242e-b04f-43bb-be0d-cfcf7a41da8f | |
| cris.virtualsource.orcid | feed31a7-95f4-46e2-b373-180a042de8af | |
| cris.virtualsource.orcid | db320297-cc3b-4024-b9e1-7ae8d8240862 | |
| cris.virtualsource.orcid | 1fd77399-4d0a-4004-8a7f-9634c67c90de | |
| cris.virtualsource.orcid | e0967756-7be0-4062-86d9-76768115dc1b | |
| dc.contributor.author | Arvind, Shikhar | |
| dc.contributor.author | Fallica, Roberto | |
| dc.contributor.author | Bezard, Philippe | |
| dc.contributor.author | Petersen, John | |
| dc.contributor.author | De Gendt, Stefan | |
| dc.contributor.author | Larsen, Esben W. | |
| dc.contributor.imecauthor | Arvind, Shikhar | |
| dc.contributor.imecauthor | Fallica, Roberto | |
| dc.contributor.imecauthor | Bezard, Philippe | |
| dc.contributor.imecauthor | Petersen, John | |
| dc.contributor.imecauthor | De Gendt, Stefan | |
| dc.contributor.imecauthor | Larsen, Esben W. | |
| dc.contributor.orcidimec | Arvind, Shikhar::0000-0002-4748-7763 | |
| dc.contributor.orcidimec | Fallica, Roberto::0000-0003-4523-9624 | |
| dc.contributor.orcidimec | Bezard, Philippe::0000-0003-2499-0240 | |
| dc.contributor.orcidimec | Petersen, John::0000-0003-4815-3770 | |
| dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
| dc.date.accessioned | 2025-04-01T06:43:19Z | |
| dc.date.available | 2025-04-01T06:43:19Z | |
| dc.date.issued | 2025 | |
| dc.identifier.doi | 10.1116/6.0004555 | |
| dc.identifier.issn | 0734-2101 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/45475 | |
| dc.original.retracted | https://imec-publications.be/handle/20.500.12860/45362 | |
| dc.publisher | A V S AMER INST PHYSICS | |
| dc.source.beginpage | 037001 | |
| dc.source.issue | 3 | |
| dc.source.journal | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | |
| dc.source.numberofpages | 1 | |
| dc.source.volume | 43 | |
| dc.title | Correction to: Impact of vacuum ultraviolet photons on ultrathin negative tone resists for extreme ultraviolet lithography during plasma etching (vol 43, 023007, 2025) | |
| dc.type | Journal article correction | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |