Publication:

Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation

Date

2025-05-15
Proceedings Paper
https://doi.org/10.1109/IRPS48204.2025.10983050
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dc.contributor.authorVishwakarma, Kavita
dc.contributor.authorLee, Kookjin
dc.contributor.authorKruv, Anastasiia
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorvan Setten, Michiel
dc.contributor.authorPashartis, Christopher
dc.contributor.authorOkudur, Oguzhan Orkut
dc.contributor.authorGonzalez, Mario
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorVishwakarma, Kavita
dc.contributor.imecauthorLee, Kookjin
dc.contributor.imecauthorKruv, Anastasiia
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.imecauthorPashartis, Christopher
dc.contributor.imecauthorOkudur, Oguzhan Orkut
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecLee, Kookjin::0000-0002-9896-1090
dc.contributor.orcidimecVishwakarma, Kavita::0000-0003-0503-0519
dc.contributor.orcidimecKruv, Anastasiia::0000-0002-0210-4941
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.contributor.orcidimecPashartis, Christopher::0000-0002-9102-4993
dc.contributor.orcidimecOkudur, Oguzhan Orkut::0000-0002-4790-7772
dc.contributor.orcidimecGonzalez, Mario::0000-0003-4374-4854
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecBelmonte, Attilio::0000-0002-3947-1948
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2025-06-06T11:46:40Z
dc.date.available2025-06-06T11:46:40Z
dc.date.issued2025-05-15
dc.identifier.doi10.1109/IRPS48204.2025.10983050
dc.identifier.issn1938-1891
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45772
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate30 March 2025 - 03 April 2025
dc.source.conferencelocationMonterey, CA, USA
dc.source.journalIEEE IRPS
dc.source.numberofpages6
dc.subject.keywordsIndium Gallium Zinc Oxide (IGZO), Thin Film Transistor (TFT), Mechanical stress (MS), Positive Bias Temperature Instability (PBTI), Finite Element Modelling (FEM), trapping
dc.title

Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation

dc.typeProceedings paper
dspace.entity.typePublication
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