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Conference contributions
Cu interconnects and low-k dielectrics, Challenges for chip interconnections and packaging
Publication:
Cu interconnects and low-k dielectrics, Challenges for chip interconnections and packaging
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beyne, Eric
Journal
Abstract
Description
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1990
since deposited on 2021-10-15
4
last month
1
last week
Acq. date: 2025-12-15
Citations
Metrics
Views
1990
since deposited on 2021-10-15
4
last month
1
last week
Acq. date: 2025-12-15
Citations